ARXPS-Based Concentration Profiles Restoration Applied to Adsorbate/Metal Systems

ARXPS-Based Concentration Profiles Restoration Applied to Adsorbate/Metal Systems Научная публикация

Журнал

Surface Science
ISSN: 0039-6028

Вых. Данные

Год: 1992, Том: 271, Номер: 3, Страницы: 493-500 Страниц : 8 DOI: 10.1016/0039-6028(92)90910-X

Авторы

Baschenko O.A. ¹ , Bukhtiyarov V.I. ² , Boronin A.I. ²

Организации

1	Institute of General and Inorganic Chemistry, Russian Academy of Sciences, Leninsky Prospect 31, 117907 Moscow, Russia
2	Institute of Catalysis, Lavrentieva Prospect 5, 630090 Novosibirsk, Russia

Depth concentration profiles for the O2/Ir(111), CO/Ir(111) and O2/Ag adsorbate/metal systems have been obtained by means of the numerical analysis of the ARXPS data. For the O2/Ir(111) and CO/Ir(111) systems our technique has been found to yield correct coverage estimates and elements in-depth distributions with near-atomic resolution. For the O2/Ag system the oxygen atoms with E(BO 1s) = 528.4 eV have been shown to incorporate between two upper substrate layers, while being completely absent on the surface. The oxygen atoms with E(BO 1s) = 530.5 eV behave quite differently, being present both upon the surface and in the outermost substrate layer.

Baschenko O.A. , Bukhtiyarov V.I. , Boronin A.I.
ARXPS-Based Concentration Profiles Restoration Applied to Adsorbate/Metal Systems
Surface Science. 1992. V.271. N3. P.493-500. DOI: 10.1016/0039-6028(92)90910-X WOS Scopus РИНЦ CAPlusCA OpenAlex Sciact

Поступила в редакцию:	12 авг. 1991 г.
Принята к публикации:	10 дек. 1991 г.
Опубликована в печати:	1 янв. 1992 г.
Опубликована online:	25 сент. 2002 г.

Web of science:	WOS:A1992JA63900022
Scopus:	2-s2.0-0026882334
РИНЦ:	31146785
Chemical Abstracts:	1992:456604
Chemical Abstracts (print):	117:56604
OpenAlex:	W2024945738
Sciact:	14536

БД	Цитирований
OpenAlex	16